Our Research Infrastructure

ANC Korea is committed to improving our customers' quality of life and contributing to a better world through innovation. We maintain state-of-the-art research equipment to develop products with exceptional quality and cutting-edge technology.

Advanced Analysis & Testing Equipment

SEM Scanning Electron Microscope
SEM (Scanning Electron Microscope) SNE-4500M
SEC, USA

Advanced electron beam technology for detailed surface microstructure and morphology analysis. This high-resolution instrument enables observation of structures down to nanometer scales, making it essential for material surface characterization and comprehensive quality inspection.

XRF X-ray Fluorescence Analyzer
XRF (X-ray Fluorescence Analyzer) X-ray XDL
Helmut-Fischer, Germany

Precision X-ray analysis system for material composition determination, including metal alloy analysis, coating thickness measurement, and contaminant detection. The non-destructive testing capability makes this instrument invaluable for maintaining consistent product quality standards.

ICP Inductively Coupled Plasma Optical Emission Spectrometer
ICP-OES (Inductively Coupled Plasma Optical Emission Spectrometer) Optima 8000
Perkin Elmer, USA

High-precision elemental analysis system utilizing plasma technology to measure emission spectra. Capable of simultaneous multi-element analysis with detection limits reaching parts-per-billion levels, providing comprehensive qualitative and quantitative sample characterization.

Optical Microscope
Optical Microscope BX-51
Olympus, Japan

Professional optical microscopy system for detailed observation of surface structures, particles, and defects on metal surfaces. With magnification capabilities up to 1000x, this instrument supports microstructural analysis and precise quality control procedures.

UV/VIS Spectrophotometer
UV/VIS Spectrophotometer OPTIZEN POP
KLAB, Korea

Versatile spectroscopic analyzer for measuring sample transmittance and absorbance across ultraviolet and visible light spectra. Essential for determining concentration, purity, and other quantitative parameters in solution analysis and additive characterization studies.